The Double Pulse MOSFET tester is a system used to characterize losses in Silicon-Carbide (SiC) high-power MOSFET semiconductor devices. C C2 = + Should individual gate drivers be used for each MOSFET in the group?MOSFET packaging considerations for paralleled groupsBare die (KGD) MOSFETsLFPAK MOSFETsInductive energy dissipation in paralleled MOSFETsAvalanchinglow side MOSFET group driving a high side inductive load MOSFET I-V Characteristics. metal-oxide-semiconductor field-effect transistor (